Abstract:
Exciton spectra are studied in Cu2ZnSiSe4 single crystals at 10 and 300K by means of reflection spectroscopy. The exciton parameters, dielectric constant and free carriers effective masses are deduced from experimental spectra by calculations in the framework of a model taking into account the spatial dispersion and the presence of a dead-layer. The structure found in the reflectivity was analyzed and related to the theoretical electronic band structure of close related Cu2ZnSiS4 semiconductor.