GRABCO, Daria; DYNTU, M.; RUSU, Emil
(Institutul de Inginerie Electronică şi Nanotehnologii "D. Ghiţu", 2011)
The fine defect structure (native microdefects and as-grown dislocations) of pure and doped InP crystals are considered. Some kinds of point defects are detected. They are connected with the technology of crystal growth ...