ERGIN, F. Belgin; TURAN, Raşit; SHISHIYANU, Sergiu T.; YILMAZ, Ercan
(Elservier, 2010)
Radiation effects on Metal Oxide Semiconductor (MOS) capacitors with a HfO2 gate insulator have been studied. Because HfO2 is a promising high-k dielectric material for microelectronic applications, radiation effects on ...