Browsing Articole by Author "YILMAZ, Ercan"

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  • ERGIN, F. Belgin; TURAN, Raşit; SHISHIYANU, Sergiu T.; YILMAZ, Ercan (Elservier, 2010)
    Radiation effects on Metal Oxide Semiconductor (MOS) capacitors with a HfO2 gate insulator have been studied. Because HfO2 is a promising high-k dielectric material for microelectronic applications, radiation effects on ...

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