TIGINYANU, I. M.; PYSHNAYA, N. B.; CALIN, M. V.; URSAKI, V. V.
(IEEE, 1994)
There has been increasing attention focused on the investigation of the /spl ap/0.4 eV electron trap in indium phosphide. According to G. Hirt et. al. (1993), the defect corresponding to that trap plays a major role in the ...