Abstract:
Since the discovery of its superconductivity (J. Nagamatsu, N. Nakagawa, T. Muranka, et al., 2001, Nature, 410, 63), MgB2 attracts considerable attention. A number of groups have intensively tried to fabricate high-quality MgB2 films during the last years. However, the surface quality which is necessary for microelectronic device applications is still far from being achieved In this work we report the growth and the properties of high-quality films which are prepared in a two-step process: 1) deposition of the precursor films and 2) their annealing in Mg vapor with a specially designed, reusable reactor (C. B. Eom, et al., 2001, Nature, 411, 558). The films were grown on single crystal substrates of R-cut Al2O3 as well as of Al2O3 (100), (128° rot) LiNbO3 and MgO (100). The highest value of Tc = 39.4 K was observed for films deposited at 770 K on sapphire and MgO and annealed at 1120 K for one hour. Our method allows also the growth of high-Tc smooth films with high reproducibility and opens perspectives for the use of MgB2 films in microelectronics, especially for high-frequency applications.