dc.contributor.author | POPA, Mihail | |
dc.contributor.author | TIGINYANU, Ion | |
dc.contributor.author | URSAKI, Veacheslav | |
dc.date.accessioned | 2020-10-27T14:29:49Z | |
dc.date.available | 2020-10-27T14:29:49Z | |
dc.date.issued | 2017 | |
dc.identifier.citation | POPA, Mihail; TIGINYANU, Ion; URSAKI, Veacheslav. Optical constants of ZnSxSe1–x thin films calculated from transmission spectra. In: Moldavian Journal of the Physical Sciences. 2017, nr. 1-2(16), pp. 78-93. ISSN 1810-648X. | en_US |
dc.identifier.uri | http://repository.utm.md/handle/5014/10912 | |
dc.description.abstract | We report the results of calculations of some optical parameters of ZnSxSe1–x thin films based on measured transmission spectra by using the Swanepoel’s method, the Wemple– DiDomenico single-oscillator model, and the Sellmeier single-oscillator model. The following optical constants have been determined: refractive index n(λ),extinction coefficient k(λ), the E0 parameter, dispersion parameter Ed, oscillator strength S0, real ε1(λ) and imaginary ε 2(λ) parts of the dielectric constant, high-frequency dielectric constant ε ∞, and ratio N/m*. The obtained data are in good agreement with the data for bulk ZnSe and ZnS crystals. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Institutul de Inginerie Electronică şi Nanotehnologii "D. Ghiţu" al AŞM | en_US |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
dc.subject | thin films | en_US |
dc.subject | crystals | en_US |
dc.title | Optical constants of ZnSxSe1–x thin films calculated from transmission spectra | en_US |
dc.type | Article | en_US |
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