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Optical constants of ZnSxSe1–x thin films calculated from transmission spectra

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dc.contributor.author POPA, Mihail
dc.contributor.author TIGINYANU, Ion
dc.contributor.author URSAKI, Veacheslav
dc.date.accessioned 2020-10-27T14:29:49Z
dc.date.available 2020-10-27T14:29:49Z
dc.date.issued 2017
dc.identifier.citation POPA, Mihail; TIGINYANU, Ion; URSAKI, Veacheslav. Optical constants of ZnSxSe1–x thin films calculated from transmission spectra. In: Moldavian Journal of the Physical Sciences. 2017, nr. 1-2(16), pp. 78-93. ISSN 1810-648X. en_US
dc.identifier.uri http://repository.utm.md/handle/5014/10912
dc.description.abstract We report the results of calculations of some optical parameters of ZnSxSe1–x thin films based on measured transmission spectra by using the Swanepoel’s method, the Wemple– DiDomenico single-oscillator model, and the Sellmeier single-oscillator model. The following optical constants have been determined: refractive index n(λ),extinction coefficient k(λ), the E0 parameter, dispersion parameter Ed, oscillator strength S0, real ε1(λ) and imaginary ε 2(λ) parts of the dielectric constant, high-frequency dielectric constant ε ∞, and ratio N/m*. The obtained data are in good agreement with the data for bulk ZnSe and ZnS crystals. en_US
dc.language.iso en en_US
dc.publisher Institutul de Inginerie Electronică şi Nanotehnologii "D. Ghiţu" al AŞM en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject thin films en_US
dc.subject crystals en_US
dc.title Optical constants of ZnSxSe1–x thin films calculated from transmission spectra en_US
dc.type Article en_US


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