dc.contributor.author | PYRTSAC, C. | |
dc.contributor.author | SHIKIMAKA, O. | |
dc.contributor.author | GRABCO, D. | |
dc.contributor.author | PRISACARU, A. | |
dc.contributor.author | PARVAN, V. | |
dc.contributor.author | URSAKI, V. | |
dc.date.accessioned | 2020-09-08T06:18:21Z | |
dc.date.available | 2020-09-08T06:18:21Z | |
dc.date.issued | 2014 | |
dc.identifier.citation | PYRTSAC, C., SHIKIMAKA, O., GRABCO, D. et al. DSCM 19p mechanical behavior at point contact of CdGa2S4 and CdGa2Se4. In: Materials Science and Condensed Matter Physics: mater. a 7-a conf. intern., 16-19 septembrie, 2014. Chişinău, 2014, p. 153. | en_US |
dc.identifier.uri | http://repository.utm.md/handle/5014/9266 | |
dc.description | Sursa: Conferința –"Materials Science and Condensed Matter Physics", Chișinău, Moldova, 16-19 septembrie 2014.→ https://ibn.idsi.md/collection_view/169 | en_US |
dc.description.abstract | In this study the deformation peculiarities of CdGa2S4 and CdGa2Se4 subjected to point contact (indentation) were investigated. By applying a depth-sensing nanoindentation technique with Berkovich pyramidal diamond indenter, the hardness (H) and Young‟s modulus (E) were evaluated. The values of H and E show an increase with load decrease for both compounds that can be the result of the known indentation size effect. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Academia de Ştiinţe a Moldovei | en_US |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
dc.subject | semiconductor compounds | en_US |
dc.title | Mechanical behavior at point contact of CdGa2S4 and CdGa2Se4 | en_US |
dc.type | Article | en_US |
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