BIBER, S.; COJOCARI, O.; REHM, G.; MOTTET, B.; RODRIGUEZ-GIRONES, M.; SCHMIDT, L.-P.; HARTNAGEL, H. L.
(IEEE, 2004)
An automated system is developed to evaluate a large number Schottky diodes for terahertz applications with respect to their dc and noise characteristics using a highly sensitive noise measurement technique for one port ...