Optical-electronic technologies in materials analysis

PERJU, Veacheslav L.; CASASENT, David P.; FESHCHENKO, Valeriy S.; FESHCHENKO, Lubov V.

dc.contributor.author	PERJU, Veacheslav L.
dc.contributor.author	CASASENT, David P.
dc.contributor.author	FESHCHENKO, Valeriy S.
dc.contributor.author	FESHCHENKO, Lubov V.
dc.date.accessioned	2022-04-22T07:39:50Z
dc.date.available	2022-04-22T07:39:50Z
dc.date.issued	2005
dc.identifier.citation	PERJU, Veacheslav L., CASASENT, David P., FESHCHENKO, Valeriy S. et al. Optical-electronic technologies in materials analysis. In: Optical Pattern Recognition 16. 2005. –V. 5816, pp. 315-320.	en_US
dc.identifier.uri	https://doi.org/10.1117/12.604321
dc.identifier.uri	http://repository.utm.md/handle/5014/20205
dc.description	Access full text - https://doi.org/10.1117/12.604321	en_US
dc.description.abstract	It is proposed a new optical electronic approach for effective, simple and non expensive testing of the materials. An optical correlator is used for high speed features extraction, which characterize the distribution of the informational important elements in the crystallographic image. The digital “portrait” of the analyzed material is constructed which is compared with the set of the standard “portraits” on the base of which the level of the quality of the material is determined. The method permits to automate the process of the crystallographic images analyses and to increase the reliability of the results.	en_US
dc.language.iso	en	en_US
dc.publisher	SPIE	en_US
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 United States	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.subject	material testing	en_US
dc.subject	crystallographic images	en_US
dc.subject	optical correlators	en_US
dc.title	Optical-electronic technologies in materials analysis	en_US
dc.type	Article	en_US