Nanocrystalline Tellurium Films: Fabrication and Gas Sensing Properties

TSIULYANU, D.; MORARU, A.

dc.contributor.author	TSIULYANU, D.
dc.contributor.author	MORARU, A.
dc.date.accessioned	2021-01-26T11:17:22Z
dc.date.available	2021-01-26T11:17:22Z
dc.date.issued	2015
dc.identifier.citation	TSIULYANU, D., MORARU, A. Impedance Spectroscopy of Tellurium Thin Films Sensitive to NO2. In: Nanoscience Advances in CBRN Agents Detection, Information and Energy Security. NATO Science for Peace and Security Series A: Chemistry and Biology. 2015, pp. 489-408. ISBN 978-94-017-9697-2.	en_US
dc.identifier.uri	https://doi.org/10.1007/978-94-017-9697-2_40
dc.identifier.uri	http://repository.utm.md/handle/5014/12570
dc.description	Acces full text: https://doi.org/10.1007/978-94-017-9697-2_40	en_US
dc.description.abstract	A brief review of achievements in the fabrication of nanostructured tellurium thin films for applications in sensor technology is reported, paying particular attention to physical growth of nanocrystalline films in vacuum.	en_US
dc.language.iso	en	en_US
dc.publisher	Springer Nature Switzerland	en_US
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 United States	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.subject	nanostructured tellurium thin films	en_US
dc.subject	tellurium thin films	en_US
dc.subject	thin films	en_US
dc.subject	films	en_US
dc.title	Nanocrystalline Tellurium Films: Fabrication and Gas Sensing Properties	en_US
dc.type	Article	en_US