Characterization of thin ZnO film by optical second harmonic generation: experiment and theory

BUINITSKAYA, G.; KRAVETSKY, I.; KULYUK, L.; MIROVITSKII, V.; RUSU, E.

dc.contributor.author	BUINITSKAYA, G.
dc.contributor.author	KRAVETSKY, I.
dc.contributor.author	KULYUK, L.
dc.contributor.author	MIROVITSKII, V.
dc.contributor.author	RUSU, E.
dc.date.accessioned	2021-01-12T11:56:53Z
dc.date.available	2021-01-12T11:56:53Z
dc.date.issued	1998
dc.identifier.citation	BUINITSKAYA, G., KRAVETSKY, I., KULYUK, L. Characterization of thin ZnO film by optical second harmonic generation: experiment and theory. In: International Semiconductor Conference: proceedings CAS 2003, 28 Sept.-2 Oct. 2003, Sinaia, Romania, 2003, V. 2, pp. 319-322.	en_US
dc.identifier.uri	https://doi.org/10.1109/SMICND.2003.1252444
dc.identifier.uri	http://repository.utm.md/handle/5014/12415
dc.description	Acces full text: https://doi.org/10.1109/SMICND.2003.1252444	en_US
dc.description.abstract	Thin polycrystalline zinc oxide film deposed on glass substrate have been investigated by optical second harmonic generation (SHG). The intensity of SHG in dependence of rotation angle of fundamental beam polarization for several incident angles has been measured. Developed theoretical model taking into account multiple reflections of light into the sample allows us to reveal a set of effective characteristics of film.	en_US
dc.language.iso	en	en_US
dc.publisher	IEEE	en_US
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 United States	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.subject	films	en_US
dc.subject	glass substrates	en_US
dc.title	Characterization of thin ZnO film by optical second harmonic generation: experiment and theory	en_US
dc.type	Article	en_US