Pseudo-ring tests resolution for dynamic single faults in word-oriented memory

GRITCOV, S. S.; SOROKIN, G. F.; SHESTACOVA, T. V.

dc.contributor.author	GRITCOV, S. S.
dc.contributor.author	SOROKIN, G. F.
dc.contributor.author	SHESTACOVA, T. V.
dc.date.accessioned	2020-12-21T12:54:47Z
dc.date.available	2020-12-21T12:54:47Z
dc.date.issued	2018
dc.identifier.citation	GRITCOV, S. S., SOROKIN, G. F., SHESTACOVA, T. V. Pseudo-ring tests resolution for dynamic single faults in word-oriented memory. In: Tekhnologiya i Konstruirovanie v Elektronnoi Apparature. 2018, nr. 5-6, pp. 3-9. ISSN 2225-5818.	en_US
dc.identifier.uri	https://doi.org/10.15222/TKEA2018.5-6.03
dc.identifier.uri	http://repository.utm.md/handle/5014/12243
dc.description	Acces full text - https://doi.org/10.15222/TKEA2018.5-6.03	en_US
dc.description.abstract	This paper presents single dynamic faults and methods for their detection. Such dynamic faults as dRDF, dDRDF and dIRF are considered in detail. Also, pseudo-ring testing and the principles of single dynamic faults detecting by pseudo-ring tests are considered. The paper presents the resolution determination results for pseudo-ring tests in relation to these faults in the word-oriented memory. Also, a comparative analysis of the pseudo-ring tests with known March tests is done. The results show that pseudo-ring tests with an algorithmic complexity of (30—60)N, where N is the number of all memory cells, can cover from 75 to 100% of all single dynamic faults. This advantage allows using pseudo-ring tests as an alternative to existing classical and March tests.	en_US
dc.language.iso	en	en_US
dc.publisher	Politehperiodika	en_US
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 United States	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.subject	dynamic single faults	en_US
dc.subject	pseudo-ring testing	en_US
dc.subject	iteration	en_US
dc.title	Pseudo-ring tests resolution for dynamic single faults in word-oriented memory	en_US
dc.type	Article	en_US