Scaling behavior of resistive transitions in thin superconducting films

FOGEL, N. Ya.; SIDORENKO, A. S.

dc.contributor.author	FOGEL, N. Ya.
dc.contributor.author	SIDORENKO, A. S.
dc.date.accessioned	2020-12-17T11:44:16Z
dc.date.available	2020-12-17T11:44:16Z
dc.date.issued	1978
dc.identifier.citation	FOGEL, N. Ya., SIDORENKO, A. S. Scaling behavior of resistive transitions in thin superconducting films. In: Physics Letters A, 1978, V. 68, Nr. 5, pp. 456-458. ISSN 0375-9601.	en_US
dc.identifier.uri	https://doi.org/10.1016/0375-9601(78)90627-8
dc.identifier.uri	http://repository.utm.md/handle/5014/12177
dc.description	Access full text - https://doi.org/10.1016/0375-9601(78)90627-8	en_US
dc.description.abstract	Resistive transitions to the superconducting state have been investigated for variations of both temperature and external magnetic field. Experimental data were obtained for thin films of vanadium and indium. The excess conductivity σ' in the transition region was found to satisfy scaling laws (law of corresponding states), i.e. σ' is described by some universal function of the reduced variables τ = 1 − T/Tc, h = 1 − H/Hc, and j = 1 − I/Ic.	en_US
dc.language.iso	en	en_US
dc.publisher	Elservier	en_US
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 United States	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.subject	superconductivity	en_US
dc.subject	magnetic fields	en_US
dc.title	Scaling behavior of resistive transitions in thin superconducting films	en_US
dc.type	Article	en_US