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Photoluminescence and Raman scattering in In0.53Ga0.47As/InP:Dy

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dc.contributor.author PODOR, Balint
dc.contributor.author VIGNAUD, D.
dc.contributor.author TIGINYANU, I. M.
dc.contributor.author CSONTOS, L.
dc.contributor.author URSAKI, V. V.
dc.contributor.author SHONTYA, V. P.
dc.date.accessioned 2020-11-20T11:15:46Z
dc.date.available 2020-11-20T11:15:46Z
dc.date.issued 1997
dc.identifier.citation PODOR, Balint, VIGNAUD, D., TIGINYANU, I. M. et al. Raman and Hall-effect characterization of Zn/sup +//P/sup +/ co-implanted GaAs subjected to rapid thermal annealing. In: Material Science and Material Properties for Infrared Optoelectronics: pros. , 1997, V. 3182, pp. 142 - 145. en_US
dc.identifier.uri https://doi.org/10.1117/12.280418
dc.identifier.uri http://repository.utm.md/handle/5014/11610
dc.description Acces full text: https://doi.org/10.1117/12.280418 en_US
dc.description.abstract High purity In0.53Ga0.47As grown on InP by liquid phase epitaxy with small amounts of rare earth dysprosium (Dy) in the melt was investigated. The presence of Dy dramatically reduced the charge carrier and residual donor concentration, and shifted the low temperature photoluminescence peaks toward higher energies. Room temperature Raman spectra were also studied. The Raman shift of the GaAs-like longitudinal optical phonon band increased with the Dy content in the growth melt. The results were explained by the effect of gettering of unintentional donor impurities in the melt by Dy, as well as by the effect of strain modification in the layers due to the possible incorporation of Dy. en_US
dc.language.iso en en_US
dc.publisher Society of Photo-Optical Instrumentation Engineers, SPIE en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject heterostructures en_US
dc.subject earth dysprosium en_US
dc.subject melts en_US
dc.title Photoluminescence and Raman scattering in In0.53Ga0.47As/InP:Dy en_US
dc.type Article en_US


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