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dc.contributor.author PRISLOPSKI, S.
dc.contributor.author TIGINYANU, I. M.
dc.contributor.author GHIMPU, L.
dc.contributor.author MONAICO, E.
dc.contributor.author SIRBU, L.
dc.contributor.author ZHUKOVSKY, S. V.
dc.contributor.author GAPONENKO, S. V.
dc.date.accessioned 2020-11-09T10:57:48Z
dc.date.available 2020-11-09T10:57:48Z
dc.date.issued 2011
dc.identifier.citation PRISLOPSKI, S., TIGINYANU, I. M., GHIMPU, L. et al. Retroreflection from disordered porous semiconductors. In: International Conference on Transparent Optical Networks: proceedings of 13th International Conference on Transparent Optical Networks, 26 - 30 June 2011, Stockholm, Sweden, 2011, pp. 1-4. en_US
dc.identifier.uri https://doi.org/10.1109/ICTON.2011.5970957
dc.identifier.uri http://repository.utm.md/handle/5014/11224
dc.description Acces ful text: https://doi.org/10.1109/ICTON.2011.5970957 en_US
dc.description.abstract Prominent retroreflection is experimentally observed in disordered porous InP membranes. It is believed to be the result of an interplay between Fresnel-like and Bragg-like reflection for different components of an impinging wave vector, mediated by pronounced disorder and high material absorption. Retroreflection is seen to be stronger than Fresnel reflection and visible with the naked eye. The observed effect is broadband in wavelength, present in a wide range of incident angles, and (unique Fresnel reflection) largely polarization independent. It can be of use in a novel design of miniature retroreflecting optical components. en_US
dc.language.iso en en_US
dc.publisher IEEE en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject porous membranes en_US
dc.subject membranes en_US
dc.subject retroreflection en_US
dc.subject optical components en_US
dc.title Retroreflection from disordered porous semiconductors en_US
dc.type Article en_US


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