dc.contributor.author | VOLCIUC, O. S. | |
dc.contributor.author | POPA, V. | |
dc.contributor.author | TIGINYANU, I. M. | |
dc.contributor.author | SKURATOV, V. A. | |
dc.contributor.author | CHO, M. | |
dc.contributor.author | PAVLIDIS, D. | |
dc.date.accessioned | 2020-10-06T12:45:23Z | |
dc.date.available | 2020-10-06T12:45:23Z | |
dc.date.issued | 2010 | |
dc.identifier.citation | VOLCIUC, O. S., POPA, V., TIGINYANU, I. M. et al. The Impact of High Energy Ion Irradiation Upon CO Gas Sensitivity of Nanostructured GaN Epilayers. In: Электронная обработка материалов. 2010, nr. 6(46), pp. 5-7. ISSN 0013-5739. | en_US |
dc.identifier.issn | 0013-5739 | |
dc.identifier.uri | http://repository.utm.md/handle/5014/10476 | |
dc.description.abstract | Photoelectrochemically nanostructured GaN epilayers were found to exhibit good sensitivity towards CO in the temperature range from 180 to 280°C. We show that subjection of nanostructured GaN samples to 166 MeV Xe+23 ion irradiation causes considerable reduction of the gas sensitivity, while post-irradiation rapid thermal annealing results in sensitivity restoration, the effect being dependent upon the dose of irradiation and annealing temperature. A 50 % restoration of the relative sensitivity is demonstrated after rapid thermal annealing for 1 min at 800°C in samples irradiated by Xe+23 ions at a dose of 1012 cm-2. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Institute of Applied Physics, Academy of Sciences of Moldova, Chisinau, Republic of Moldova | en_US |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
dc.subject | gallium nitride | en_US |
dc.subject | nanostructures | en_US |
dc.subject | ion irradiation | en_US |
dc.subject | high energy | en_US |
dc.subject | carbon monoxide gas | en_US |
dc.subject | sensitivity | en_US |
dc.title | The Impact of High Energy Ion Irradiation Upon CO Gas Sensitivity of Nanostructured GaN Epilayers | en_US |
dc.type | Article | en_US |
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