dc.contributor.author | MORARI, Vadim | |
dc.contributor.author | RUSU, Emil | |
dc.contributor.author | CURMEI, Nicolai | |
dc.contributor.author | URSAKI, Veaceslav | |
dc.contributor.author | BRÂNCOVEANU, Oana | |
dc.contributor.author | MESTERCA, Raluca | |
dc.contributor.author | MOISE, Calin | |
dc.contributor.author | PRODANA, Mariana | |
dc.contributor.author | ENACHESCU, Marius | |
dc.date.accessioned | 2020-05-04T11:53:46Z | |
dc.date.available | 2020-05-04T11:53:46Z | |
dc.date.issued | 2018 | |
dc.identifier.citation | MORARI, Vadim, RUSU, Emil, CURMEI, Nicolai et al. Obținerea și caracterizarea filmelor subțiri în sistemul ZnSnO. In: Telecomunicaţii, Electronică şi Informatică: proc. of the 6th intern. conf., May 24-27, 2018. Chişinău, 2018, pp. 133-136. ISBN 978-9975-45-540-4. | en_US |
dc.identifier.isbn | 978-9975-45-540-4 | |
dc.identifier.uri | http://repository.utm.md/handle/5014/8068 | |
dc.description.abstract | Quasi-planar thin films with thickness of 200 – 700 nm and surface roughness around 10 nm have been prepared by aerosol spray deposition in the ZnSnO semiconductor system. Heterostructures have been produced by deposition of films on p-Si substrates and their operation as injection photodiodes has been demonstrated. | en_US |
dc.language.iso | ro | en_US |
dc.publisher | Tehnica UTM | en_US |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
dc.subject | pelicule subțiri | en_US |
dc.subject | semiconductoare | en_US |
dc.subject | pulverizare aerosoli | en_US |
dc.subject | microscopie electronică de scanare | en_US |
dc.subject | microscopie de forță atomică | en_US |
dc.subject | structură cristalografică | en_US |
dc.subject | heterojoncțiuni | en_US |
dc.subject | fotodiode | en_US |
dc.title | Obținerea și caracterizarea filmelor subțiri în sistemul ZnSnO | en_US |
dc.type | Article | en_US |
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