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Obținerea și caracterizarea filmelor subțiri în sistemul ZnSnO

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dc.contributor.author MORARI, Vadim
dc.contributor.author RUSU, Emil
dc.contributor.author CURMEI, Nicolai
dc.contributor.author URSAKI, Veaceslav
dc.contributor.author BRÂNCOVEANU, Oana
dc.contributor.author MESTERCA, Raluca
dc.contributor.author MOISE, Calin
dc.contributor.author PRODANA, Mariana
dc.contributor.author ENACHESCU, Marius
dc.date.accessioned 2020-05-04T11:53:46Z
dc.date.available 2020-05-04T11:53:46Z
dc.date.issued 2018
dc.identifier.citation MORARI, Vadim, RUSU, Emil, CURMEI, Nicolai et al. Obținerea și caracterizarea filmelor subțiri în sistemul ZnSnO. In: Telecomunicaţii, Electronică şi Informatică: proc. of the 6th intern. conf., May 24-27, 2018. Chişinău, 2018, pp. 133-136. ISBN 978-9975-45-540-4. en_US
dc.identifier.isbn 978-9975-45-540-4
dc.identifier.uri http://repository.utm.md/handle/5014/8068
dc.description.abstract Quasi-planar thin films with thickness of 200 – 700 nm and surface roughness around 10 nm have been prepared by aerosol spray deposition in the ZnSnO semiconductor system. Heterostructures have been produced by deposition of films on p-Si substrates and their operation as injection photodiodes has been demonstrated. en_US
dc.language.iso ro en_US
dc.publisher Tehnica UTM en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject pelicule subțiri en_US
dc.subject semiconductoare en_US
dc.subject pulverizare aerosoli en_US
dc.subject microscopie electronică de scanare en_US
dc.subject microscopie de forță atomică en_US
dc.subject structură cristalografică en_US
dc.subject heterojoncțiuni en_US
dc.subject fotodiode en_US
dc.title Obținerea și caracterizarea filmelor subțiri în sistemul ZnSnO en_US
dc.type Article en_US


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