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An automatic equipment for nanoelectronic devices electrical characteristics measurement
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| dc.contributor.author | BAKERENKOV, Alexander | |
| dc.contributor.author | SOLOMATIN, Anatoly | |
| dc.contributor.author | PERSHENKOV, Vyacheslav | |
| dc.contributor.author | NAGOVITSINA, Olga | |
| dc.date.accessioned | 2019-10-24T12:15:31Z | |
| dc.date.available | 2019-10-24T12:15:31Z | |
| dc.date.issued | 2013 | |
| dc.identifier.citation | BAKERENKOV, Alexander, SOLOMATIN, Anatoly, PERSHENKOV, Vyacheslav, NAGOVITSINA, Olga. An automatic equipment for nanoelectronic devices electrical characteristics measurement. In: ICNBME-2013. International Conference on Nanotechnologies and Biomedical Engineering. German-Moldovan Workshop on Novel Nanomaterials for Electronic, Photonic and Biomedical Applications: proc. of the 2th intern. conf., April 18-20, 2013. Chişinău, 2013, pp. 124-127. ISBN 978-9975-62-343-8. | en_US |
| dc.identifier.isbn | 978-9975-62-343-8 | |
| dc.identifier.uri | http://repository.utm.md/handle/5014/5224 | |
| dc.description.abstract | An automatic equipment for semiconductor device voltage-current characteristic measurement was described. Diode current sensor for current measurements was used and sensor calibration technique was presented. It provides relative accuracy 1% in wide current range (10-2A..10-10A). | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Tehnica UTM | en_US |
| dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
| dc.subject | measuring systems | en_US |
| dc.subject | current sensor | en_US |
| dc.subject | voltage-current characteristic | en_US |
| dc.subject | nanoelectronic devices | en_US |
| dc.subject | semiconductor | en_US |
| dc.title | An automatic equipment for nanoelectronic devices electrical characteristics measurement | en_US |
| dc.type | Article | en_US |
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