Π-тестирование с применением LFSR на основе приводимых полиномов

ГРИЦКОВ, С.

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dc.contributor.author	ГРИЦКОВ, С.
dc.date.accessioned	2019-07-16T08:58:04Z
dc.date.available	2019-07-16T08:58:04Z
dc.date.issued	2015
dc.identifier.citation	ГРИЦКОВ, С. Π-тестирование с применением LFSR на основе приводимых полиномов. In: Telecomunicaţii, Electronică şi Informatică: proc. of the 5th intern. conf., May 20-23, 2015. Chişinău, 2015, pp. 130-131. ISBN 978-9975-45-377-6.	en_US
dc.identifier.isbn	978-9975-45-377-6
dc.identifier.uri	http://repository.utm.md/handle/5014/3545
dc.description.abstract	In this paper pseudo-ring testing of digital memory with LFSR on bases of reducible polynomial is described. Resolution of this kind of pseudo-ring tests is presented for stuckat and coupled faults, and comparative analysis was performed regarding classical pseudo-ring tests.	en_US
dc.language.iso	ru	en_US
dc.publisher	Technical University of Moldova	en_US
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 United States	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.subject	linear-feedback shift register	en_US
dc.subject	LFSR	en_US
dc.subject	pseudo-ring tests	en_US
dc.subject	reducible polynomial	en_US
dc.subject	π-testing	en_US
dc.subject	testarea memoriei digitale	en_US
dc.subject	polinome reductibile	en_US
dc.subject	teste pseudo-inel	en_US
dc.subject	π-testare	en_US
dc.subject	тестирование цифровой памяти	en_US
dc.subject	приводимый полином	en_US
dc.subject	π-тестирование	en_US
dc.title	Π-тестирование с применением LFSR на основе приводимых полиномов	en_US
dc.type	Article	en_US