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Algorithmic Complexity of Pseudo-Ring Testing for Stuck-at Faults

Show simple item record GRIŢCOV, Serghei 2019-07-15T09:13:58Z 2019-07-15T09:13:58Z 2015
dc.identifier.citation GRIŢCOV, Serghei. Algorithmic Complexity of Pseudo-Ring Testing for Stuck-at Faults. In: Telecomunicaţii, Electronică şi Informatică: proc. of the 5th intern. conf., May 20-23, 2015. Chişinău, 2015, pp. 75-76. ISBN 978-9975-45-377-6. en_US
dc.identifier.isbn 978-9975-45-377-6
dc.description.abstract This paper describes calculation of algorithmic complexity of pseudo-ring testing obtained by simulation of stuck-at faults and realization of pseudo-ring testing of 4-bit and 8-bit memory. The method is designed for both bit- and wordoriented memory and it is invariant to the width of data bus of the memory. en_US
dc.language.iso en en_US
dc.publisher Technical University of Moldova en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri *
dc.subject pseudo-ring testing en_US
dc.subject algorithmic complexity en_US
dc.subject stuck-at faults en_US
dc.subject bit width invariance en_US
dc.subject generators polynomials en_US
dc.subject teste cu pseudo-inele en_US
dc.title Algorithmic Complexity of Pseudo-Ring Testing for Stuck-at Faults en_US
dc.type Article en_US

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