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Showing 10 out of a total of 12 results for community: Conferinţa "Microelectronics and Computer Science".
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Structural aspects in the design for testability.
COJOCARU, Ion
;
EŞANU, Mariana
(
Tehnica UTM
,
2014
)
Functional aspects in the design for testability.
COJOCARU, Ion
;
EŞANU, Mariana
(
Tehnica UTM
,
2014
)
Design for testability of combinational circuits
COJOCARU, Ion
;
FLUERASU, Cezar
;
PASCU, Adrian
(
Technical University of Moldova
,
2005
)
Studiu analitic al redundanţei CD al contraexemplului Schneider
COJOCARU, Ion
(
Technical University of Moldova
,
2009
)
Estimarea testabilității circuitului digital al contraexemplului Schneider
COJOCARU, Ion
;
ŞERBANAŢI, Luca
;
PĂVĂLOIU, Bujor
;
RADOVICI, Alexandru
;
VASILOŢEANU, Andrei
(
Technical University of Moldova
,
2009
)
Studiu structural al redundanţei circuitului digital al contraexemplului Schneider
COJOCARU, Ion
(
Technical University of Moldova
,
2009
)
Compensarea şi mascarea erorilor în conceptul DALG-II
COJOCARU, Ion
;
ŞERBANAŢI, Luca
;
PĂVĂLOIU, Bujor
;
RADOVICI, Alexandru
;
VASILOŢEANU, Andrei
(
Technical University of Moldova
,
2009
)
Parity analysis of convergent fan-out signals for the Schneider’s counterexample digital circuit
COJOCARU, Ion
;
ŞERBANAŢI, Luca
;
PĂVĂLOIU, Bujor
;
RADOVICI, Alexandru
;
VASILOŢEANU, Andrei
(
Technical University of Moldova
,
2009
)
Omogenitatea – proprietate de bază a circuitelor digitale testabile
COJOCARU, Ion
;
ŞERBANAŢI, Luca
;
PĂVĂLOIU, Bujor
;
RADOVICI, Alexandru
;
VASILOŢEANU, Andrei
(
Technical University of Moldova
,
2009
)
Principiul dualității în algebra logicii
COJOCARU, Ion
;
ŞERBANAŢI, Luca
;
PĂVĂLOIU, Bujor
;
RADOVICI, Alexandru
;
VASILOŢEANU, Andrei
(
Technical University of Moldova
,
2009
)
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Author
COJOCARU, Ion (12)
PĂVĂLOIU, Bujor (7)
RADOVICI, Alexandru (7)
VASILOŢEANU, Andrei (7)
ŞERBANAŢI, Luca (7)
EŞANU, Mariana (2)
FLUERASU, Cezar (1)
PASCU, Adrian (1)
Subject
digital circuits (4)
design for testability (3)
logic conflicts (3)
combinational circuits (2)
duality (2)
errors (2)
integrated circuits (2)
Schneider digital circuits (2)
testability (2)
complementarity (1)
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Date Issued
2009 (9)
2014 (2)
2005 (1)
Has File(s)
Yes (12)