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dc.contributor.author COJOCARU, Ion
dc.contributor.author ŞERBANAŢI, Luca
dc.contributor.author PĂVĂLOIU, Bujor
dc.contributor.author RADOVICI, Alexandru
dc.contributor.author VASILOŢEANU, Andrei
dc.date.accessioned 2024-01-12T12:21:11Z
dc.date.available 2024-01-12T12:21:11Z
dc.date.issued 2009
dc.identifier.citation COJOCARU, Ion et al. Principiul dualității în algebra logicii. In: Microelectronics and Computer Science: proc. 6th International Conference, 1-3 Oct. 2009, Chişinău, Republica Moldova, vol. 1, 2009, pp. 366-369. ISBN 978-9975-45-045-4. ISBN 978-9975-45-122-2 (vol. 1). en_US
dc.identifier.isbn 978-9975-45-045-4
dc.identifier.isbn 978-9975-45-122-2
dc.identifier.uri http://repository.utm.md/handle/5014/25822
dc.description.abstract The problem of easy testable digital circuits’ design, which appeared in the 60s of the last century, being in the permanent focus of the digital circuits’ producers, has not found its adequate solution yet. Complexity of the problem, the insufficient results of design for testability (DFT) for general case and the lack of traditional methods of logical synthesis justify the search of non-traditional solutions in the field of interaction between different scientific directions. The fundament of new design for testing concept is represented by the logical gates couples. Properties of in- and out- signals of these gates couples allow a non-traditional and extremely efficient approach to DFT problem. en_US
dc.language.iso ro en_US
dc.publisher Technical University of Moldova en_US
dc.relation.ispartof Proceeding of the 6th International Conference on "Microelectronics and Computer Science", oct.1-3, 2009, Chişinău, Moldova
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject logical algebra en_US
dc.subject logical gates en_US
dc.subject logical synthesis en_US
dc.subject testability en_US
dc.subject duality en_US
dc.title Principiul dualității în algebra logicii en_US
dc.type Article en_US


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