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dc.contributor.author COJOCARU, Ion
dc.contributor.author ŞERBANAŢI, Luca
dc.contributor.author PĂVĂLOIU, Bujor
dc.contributor.author RADOVICI, Alexandru
dc.contributor.author VASILOŢEANU, Andrei
dc.date.accessioned 2024-01-11T10:56:50Z
dc.date.available 2024-01-11T10:56:50Z
dc.date.issued 2009
dc.identifier.citation COJOCARU, Ion et al. Причины необходимости управления мощностью в стандартах CDMA. In: Microelectronics and Computer Science: proc. 6th International Conference, 1-3 Oct. 2009, Chişinău, Republica Moldova, vol. 1, 2009, pp. 263-267. ISBN 978-9975-45-045-4. ISBN 978-9975-45-122-2 (vol. 1). en_US
dc.identifier.isbn 978-9975-45-045-4
dc.identifier.isbn 978-9975-45-122-2
dc.identifier.uri http://repository.utm.md/handle/5014/25787
dc.description.abstract Once with the enhancement of the integrated circuits (IC), the number of tests and the time of creating them was augmenting much, and the detecting errors tests from the combinational circuits (CC) with convergent fan-out (CFO) couldn’t be created in the DALG-I concept of activating the unique path through the circuit. To solve this deadlock there are proposed 2 ways: 1) the projection for testability (PFT) of CC; 2) the elaboration of efficient algorithms to create the tests, which allows a fast easy way to create tests for different structures and the diminuation of number of tests. Because PFT needs long term and complex studies, the second variant was choosed: it was proposed the algorithm DALG-II of creating the tests [2], based on the simultaneous activation of all the paths CFO. The article presents the results of a study of creating the tests based on the principle DALG-I and the causes of the presence of the effects of compensation or masking the errors. en_US
dc.language.iso en en_US
dc.publisher Technical University of Moldova en_US
dc.relation.ispartof Proceeding of the 6th International Conference on "Microelectronics and Computer Science", oct.1-3, 2009, Chişinău, Moldova
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject combinational circuits en_US
dc.subject errors en_US
dc.title Aspects of generating the tests in the DALG-I concept en_US
dc.type Article en_US


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