COJOCARU, Ion; ŞERBANAŢI, Luca; PĂVĂLOIU, Bujor; RADOVICI, Alexandru; VASILOŢEANU, Andrei
(Technical University of Moldova, 2009)
Once with the enhancement of the integrated circuits (IC), the number of tests and the time of creating them was augmenting much, and the detecting errors tests from the combinational circuits (CC) with convergent fan-out ...