Browsing 2009 by Author "COJOCARU, Ion"

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  • Aspects of generating the tests in the DALG-I concept 
    COJOCARU, Ion; ŞERBANAŢI, Luca; PĂVĂLOIU, Bujor; RADOVICI, Alexandru; VASILOŢEANU, Andrei (Technical University of Moldova, 2009)
    Once with the enhancement of the integrated circuits (IC), the number of tests and the time of creating them was augmenting much, and the detecting errors tests from the combinational circuits (CC) with convergent fan-out ...
  • Compensarea şi mascarea erorilor în conceptul DALG-II 
    COJOCARU, Ion; ŞERBANAŢI, Luca; PĂVĂLOIU, Bujor; RADOVICI, Alexandru; VASILOŢEANU, Andrei (Technical University of Moldova, 2009)
    Functionality increase led to maximizing of the integrated circuits (IC) complexity. The time for test generation reached up to 10-15 months, and some of the faults of the combinational circuits (CC) with convergent fan-outs ...
  • Complementaritatea funcțiilor logice 
    COJOCARU, Ion; ŞERBANAŢI, Luca; PĂVĂLOIU, Bujor; RADOVICI, Alexandru; VASILOŢEANU, Andrei (Technical University of Moldova, 2009)
    For more than 20 years Design for Testability (DFT) is in a big impasse: the solutions proposed do not represent general methods, well argumented and formalized – they rather present cases of specific structures or particular ...
  • Estimarea testabilității circuitului digital al contraexemplului Schneider 
    COJOCARU, Ion; ŞERBANAŢI, Luca; PĂVĂLOIU, Bujor; RADOVICI, Alexandru; VASILOŢEANU, Andrei (Technical University of Moldova, 2009)
    The inefficiency of the one way activation method DALG-I was demonstrated in the base of a singleerror 6≡0 for the circuit of the Schneider’s counterexample [2]. As a consequence the DALG-II lgorithm for the simultaneous ...
  • Omogenitatea – proprietate de bază a circuitelor digitale testabile 
    COJOCARU, Ion; ŞERBANAŢI, Luca; PĂVĂLOIU, Bujor; RADOVICI, Alexandru; VASILOŢEANU, Andrei (Technical University of Moldova, 2009)
    Solving the problem of Design for Testability (DFT) supposes not just studying the modern promising ways, but deep studying of the different traditional aspects connected to synthesis of easy testable digital circuits (DC). ...
  • Parity analysis of convergent fan-out signals for the Schneider’s counterexample digital circuit 
    COJOCARU, Ion; ŞERBANAŢI, Luca; PĂVĂLOIU, Bujor; RADOVICI, Alexandru; VASILOŢEANU, Andrei (Technical University of Moldova, 2009)
    The digital circuit, DC, of the counterexample Schneider was used as a logic structure to which it was demonstrated the insufficiently of the sensitization method for one way (DALG-I), for discovering the error 6≡0 and the ...
  • Principiul dualității în algebra logicii 
    COJOCARU, Ion; ŞERBANAŢI, Luca; PĂVĂLOIU, Bujor; RADOVICI, Alexandru; VASILOŢEANU, Andrei (Technical University of Moldova, 2009)
    The problem of easy testable digital circuits’ design, which appeared in the 60s of the last century, being in the permanent focus of the digital circuits’ producers, has not found its adequate solution yet. Complexity of ...
  • Studiu analitic al redundanţei CD al contraexemplului Schneider 
    COJOCARU, Ion (Technical University of Moldova, 2009)
    The key problem of the digital circuit (DC) testability always was the elaboration of the efficient test generation methods, their importance grew once with the transition to the new generation of integrated circuits. The ...
  • Studiu structural al redundanţei circuitului digital al contraexemplului Schneider 
    COJOCARU, Ion (Technical University of Moldova, 2009)
    The structurel method and the spatial-temporal truth table description of the functionality for the DC’s methods were used with the purpose to obtain a logic description of the equivalent successive transformations. In ...

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