The method of measuring the parameters of nanostructured sensors

dc.contributor.author	VERJBITKI, Valeri
dc.contributor.author	MARTÎNIUC, Alexei
dc.date.accessioned	2022-12-27T14:19:59Z
dc.date.available	2022-12-27T14:19:59Z
dc.date.issued	2022
dc.identifier.citation	VERJBITKI, Valeri, MARTÎNIUC, Alexei. The method of measuring the parameters of nanostructured sensors. In: Electronics, Communications and Computing (IC ECCO-2022): 12th intern. conf., 20-21 Oct. 2022, Chişinău, Republica Moldova: conf. proc., Chişinău, 2022, pp. 94-97.	en_US
dc.identifier.uri	https://doi.org/10.52326/ic-ecco.2022/EL.06
dc.identifier.uri	http://repository.utm.md/handle/5014/21835
dc.description.abstract	In this paper, the data obtained from the research on the development of methods for measuring the parameters of nanostructured sensors, which is based on the use of 2 amplifiers and 2 analog-digital converters for measuring the voltages at the reference voltage source and the voltage drop on the additional resistor, which eliminates the shunt effect of the resistance of the structures investigated by the resistance input of the amplifier.	en_US
dc.language.iso	en	en_US
dc.publisher	Technical University of Moldova	en_US
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 United States	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.subject	nanostructured sensors	en_US
dc.subject	reference voltage	en_US
dc.subject	input impedance	en_US
dc.title	The method of measuring the parameters of nanostructured sensors	en_US
dc.type	Article	en_US