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dc.contributor.author DOROGAN, A.
dc.contributor.author DOROGAN, V.
dc.contributor.author VIERU, T.
dc.contributor.author SÎRBU, A.
dc.contributor.author SÎRBU, N.
dc.contributor.author ZALOMAI, V.
dc.date.accessioned 2022-09-16T05:44:40Z
dc.date.available 2022-09-16T05:44:40Z
dc.date.issued 2012
dc.identifier.citation DOROGAN, A., DOROGAN, V., VIERU, T. et al. Metodă de determinare a calităţii nanostraturilor. In: PROINVENT 2012. Salonul internaţional al cercetării ştiinţifice, inovării şi inventicii. 27 - 30 martie 2012, ed. 10, Cluj-Napoca, Romania, 2012, p. 239. ISBN 978-973-662-709-5. en_US
dc.identifier.isbn 978-973-662-709-5
dc.identifier.uri http://repository.utm.md/handle/5014/21234
dc.description În curs de brevetare. Domeniile de aplicabilitate: Nanoelectronică, optoelectronică, microelectronică. en_US
dc.description.abstract A fost elaborată o metodă de analiză a calităţii nanostraturilor utilizând calculele spectrelor optice de reflexie conform relaţiilor de dispersie ale modelului oscilatorilor multipli aplicată pentru polaritonii excitonici [1, 2]. Metoda permite determinarea factorului de amortizare, care caracterizează calitatea straturilor, perfecţiunea structurii şi, de asemenea, forţa oscilatorilor a tranziţiilor electronice. Parametrii nivelelor energetice ale straturilor cuantice şi a punctelor cuantice depistate sunt determinate prin calcule. Contururile spectrelor de reflexie sunt, de asemenea, determinate utilizând relaţiile Kramers-Kronig, care permit determinarea indicelui de refracţie n, coeficientul de extincţie χ, parte reală (ε1) şi partea imaginară (ε2) a constantei dielectrice complexe ε. en_US
dc.description.abstract An analysis method of nanostructures’ quality had been developed using the calculation of optic reflection spectra according to the dispersion relations of the multiple oscillators method applied to the excitonic polaritons [1, 2]. The method permits to determine the dumping factor, which characterizes the layers’ quality, the structure perfection and, also, the oscillators force of electronic transitions. The parameters of the revealed energetic levels of quantum wells and of quantum dots can be determined using a row of calculations. The reflection spectra contours are, also, determined using Kamers-Kronig relations, which permit to determine the refractive index n, the extinction coefficient χ, the real (ε1) and imaginary (ε2) part of the complex dielectric constant ε. en_US
dc.language.iso en en_US
dc.language.iso ro en_US
dc.publisher Universitatea Tehnică din Cluj-Napoca en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject invenţii en_US
dc.subject inventions en_US
dc.subject nanostraturi en_US
dc.subject nanostructures en_US
dc.title Metodă de determinare a calităţii nanostraturilor en_US
dc.title.alternative Method of determining the quality of nanostructures en_US
dc.type Article en_US


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  • 2012
    Ediţia X-a, 27 - 30 martie

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