dc.contributor.author | VERJBIŢKI, Valeri | |
dc.contributor.author | LUPAN, Oleg | |
dc.contributor.author | RAILEAN, Serghei | |
dc.date.accessioned | 2022-05-26T09:47:55Z | |
dc.date.available | 2022-05-26T09:47:55Z | |
dc.date.issued | 2019 | |
dc.identifier.citation | VERJBIŢKI, Valeri, LUPAN, Oleg, RAILEAN Serghei. Device for measuring the parameters of a sensor based on nanostructured semiconductor oxides in the range of the order of microwatts. In: European Exhibition of Creativity and Innovation: proc. of the 11th ed. EUROINVENT, Iasi, Romania, 2019, p. 178. ISSN 2601-4564. e-ISSN 2601-4572. | en_US |
dc.identifier.issn | 2601-4564 | |
dc.identifier.issn | 2601-4572 | |
dc.identifier.uri | http://repository.utm.md/handle/5014/20429 | |
dc.description | Patent: MD 1270 Z 2018.07.31. Exibits Clasification: 1. Environment - Pollution Control. | en_US |
dc.description.abstract | The device for measuring the parameters of a sensor based on nanostructured semiconductor oxides in the range of the order of microwatts comprises an adjustable reference voltage source, connected in series to a test sensor and a standard resistance. | en_US |
dc.language | en | |
dc.publisher | Romanian Inventors Forum | en_US |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
dc.subject | invenţii | en_US |
dc.subject | inventions | en_US |
dc.subject | nanostructured semiconductor oxides | en_US |
dc.subject | sensors | en_US |
dc.subject | microcontrollers | en_US |
dc.title | Device for measuring the parameters of a sensor based on nanostructured semiconductor oxides in the range of the order of microwatts | en_US |
dc.type | Article | en_US |
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