IRTUM – Institutional Repository of the Technical University of Moldova

Browsing Prezentări by Subject "transmission electron microscopy"

Browsing Prezentări by Subject "transmission electron microscopy"

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  • SCHÜRMANN, U.; WOLFF, N.; CIOBANU, V.; DENG, M.; KAMP, M.; RAEVSCHI, S.; BRANISTE, T.; SCHÜTT, F.; ADELUNG, R.; TIGINYANU, I.; KIENLE, L. (Australian Microscopy & Microanalysis Society, 2018)
    Gallium Nitride (GaN) is a wide-bandgap semiconductor compound with several applications in the field of optoelectronics, field-effect transistors and sensors. Different novel and outstanding GaN morphologies were analyzed ...

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