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Showing 10 out of a total of 10 results for community: Conferinţe.
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Design for testability of combinational circuits
COJOCARU, Ion
;
FLUERASU, Cezar
;
PASCU, Adrian
(
Technical University of Moldova
,
2005
)
Studiu analitic al redundanţei CD al contraexemplului Schneider
COJOCARU, Ion
(
Technical University of Moldova
,
2009
)
Estimarea testabilității circuitului digital al contraexemplului Schneider
COJOCARU, Ion
;
ŞERBANAŢI, Luca
;
PĂVĂLOIU, Bujor
;
RADOVICI, Alexandru
;
VASILOŢEANU, Andrei
(
Technical University of Moldova
,
2009
)
Studiu structural al redundanţei circuitului digital al contraexemplului Schneider
COJOCARU, Ion
(
Technical University of Moldova
,
2009
)
Compensarea şi mascarea erorilor în conceptul DALG-II
COJOCARU, Ion
;
ŞERBANAŢI, Luca
;
PĂVĂLOIU, Bujor
;
RADOVICI, Alexandru
;
VASILOŢEANU, Andrei
(
Technical University of Moldova
,
2009
)
Parity analysis of convergent fan-out signals for the Schneider’s counterexample digital circuit
COJOCARU, Ion
;
ŞERBANAŢI, Luca
;
PĂVĂLOIU, Bujor
;
RADOVICI, Alexandru
;
VASILOŢEANU, Andrei
(
Technical University of Moldova
,
2009
)
Omogenitatea – proprietate de bază a circuitelor digitale testabile
COJOCARU, Ion
;
ŞERBANAŢI, Luca
;
PĂVĂLOIU, Bujor
;
RADOVICI, Alexandru
;
VASILOŢEANU, Andrei
(
Technical University of Moldova
,
2009
)
Principiul dualității în algebra logicii
COJOCARU, Ion
;
ŞERBANAŢI, Luca
;
PĂVĂLOIU, Bujor
;
RADOVICI, Alexandru
;
VASILOŢEANU, Andrei
(
Technical University of Moldova
,
2009
)
Aspects of generating the tests in the DALG-I concept
COJOCARU, Ion
;
ŞERBANAŢI, Luca
;
PĂVĂLOIU, Bujor
;
RADOVICI, Alexandru
;
VASILOŢEANU, Andrei
(
Technical University of Moldova
,
2009
)
Complementaritatea funcțiilor logice
COJOCARU, Ion
;
ŞERBANAŢI, Luca
;
PĂVĂLOIU, Bujor
;
RADOVICI, Alexandru
;
VASILOŢEANU, Andrei
(
Technical University of Moldova
,
2009
)
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Author
COJOCARU, Ion (10)
PĂVĂLOIU, Bujor (7)
RADOVICI, Alexandru (7)
VASILOŢEANU, Andrei (7)
ŞERBANAŢI, Luca (7)
FLUERASU, Cezar (1)
PASCU, Adrian (1)
Subject
digital circuits (4)
logic conflicts (3)
combinational circuits (2)
design for testability (2)
errors (2)
integrated circuits (2)
Schneider digital circuits (2)
testability (2)
counterexample Schneider (1)
design (1)
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Date Issued
2009 (9)
2005 (1)
Has File(s)
Yes (10)