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Browsing Colecția instituțională by Author "KLIMM, S."

Browsing Colecția instituțională by Author "KLIMM, S."

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  • SIDORENKO, A. S.; ZDRAVKOV, V. I.; PREPELITSA, A. A.; HELBIG, C.; LUO, Y.; GSELL, S.; SCHRECK, M.; KLIMM, S.; HORN, S.; TAGIROV, L. R.; TIDECKS, R. (WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim, 2003)
    We investigated Nb/Ni bilayers prepared by magnetron sputtering on glass subtrates. The quality of the films was characterized by small-angle X-ray diffraction analysis. The thickness of the layers was determined by the ...
  • SIDORENKO, A. S.; ZDRAVKOV, V. I.; PREPELITSA, A. A.; HELBIG, C.; LUO, Y.; GSELL, S.; SCHRECK, M.; KLIMM, S.; HORN, S.; TAGIROV, L. R.; TIDECKS, R. (Elservier, 2003)
    We investigated Nb/Ni bilayers prepared by DC magnetron sputtering on glass substrates. The quality of the films was characterized by small-angle X-ray diffraction analysis. The thickness of the layers was determined by ...
  • SIDORENKO, A.; ZDRAVKOV, V.; RYAZANOV, V.; HORN, S.; KLIMM, S.; TIDECKS, R.; WIXFORTH, A.; KOCH, Th.; SCHIMMEL, Th. (Taylor & Francis, 2005)
    The origin of the resistive transition broadening of superconducting MgB2 thin films is investigated. Thermally activated flux flow is found to be responsible for the resistivity in the vicinity of the critical temperature. ...

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