dc.contributor.author | OZOL, Dmitry | |
dc.date.accessioned | 2020-12-07T11:53:01Z | |
dc.date.available | 2020-12-07T11:53:01Z | |
dc.date.issued | 2017 | |
dc.identifier.citation | OZOL, Dmitry. Mechanisms of Energy Loss of Fast Electrons (1-100 keV) in Semiconductors and Dielectrics and Their Impact on Efficiency of Cathodoluminophores. In: Microelectronics and Computer Science: proc. of the 9th intern. conf., October 19-21, 2017. Chişinău, 2017, pp. 65-68. ISBN 978-9975-4264-8-0. | en_US |
dc.identifier.isbn | 978-9975-4264-8-0 | |
dc.identifier.uri | http://repository.utm.md/handle/5014/11925 | |
dc.description.abstract | The processes of energy loss by electrons in semiconductors and dielectrics are complex and not fully understood to date. These processes determine the mean pair-creation energy. Its value is important for many technical applications such as scintillators, betavoltaics, cathodoluminescence, etc. The main channels of energy losses can be as follows: impact ionization, excitation of collective oscillations of high energy (plasmons) or low energy (phonons). | en_US |
dc.language.iso | en | en_US |
dc.publisher | Technical University of Moldova | en_US |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
dc.subject | cathodoluminescence | en_US |
dc.subject | electron energy loss | en_US |
dc.subject | impact ionization | en_US |
dc.subject | pair creation energy | en_US |
dc.subject | plasmon | en_US |
dc.title | Mechanisms of Energy Loss of Fast Electrons (1-100 keV) in Semiconductors and Dielectrics and Their Impact on Efficiency of Cathodoluminophores | en_US |
dc.type | Article | en_US |
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