| dc.contributor.author | PADURARU, Constantin-Bogdan | |
| dc.contributor.author | ADAM, Maricel | |
| dc.contributor.author | DRAGOMIR, Alin | |
| dc.contributor.author | CHIRIAC, Gabriel | |
| dc.contributor.author | ANTON, Adrian | |
| dc.contributor.author | RACHIER, Vasile | |
| dc.date.accessioned | 2026-03-15T07:00:47Z | |
| dc.date.available | 2026-03-15T07:00:47Z | |
| dc.date.issued | 2025 | |
| dc.identifier.citation | PADURARU, Constantin-Bogdan; Maricel ADAM; Alin DRAGOMIR; Gabriel CHIRIAC; Adrian ANTON and Vasile RACHIER. Infrared thermal stresses monitoring of medium voltage switchgear cabinet. In: SIELMEN 2025 -Proceedings of the 15th International Conference on Electromechanical and Energy Systems, Iasi, Romania, 15-17 October, 2025. "Gheorghe Asachi" Technical University of Iași, 2025, pp. 293-29. ISBN 979-8-3315-8512-9, eISBN 979-8-3315-8511-2. | en_US |
| dc.identifier.isbn | 979-8-3315-8511-2 | |
| dc.identifier.isbn | 979-8-3315-8512-9 | |
| dc.identifier.uri | https://doi.org/10.1109/SIELMEN67352.2025.11260686 | |
| dc.identifier.uri | https://repository.utm.md/handle/5014/35710 | |
| dc.description | Access full text: https://doi.org/10.1109/SIELMEN67352.2025.11260686 | en_US |
| dc.description.abstract | This paper clearly asserts the effectiveness of the infrared thermography method for monitoring Medium Voltage (MV) switchgear cabinets. A detailed description of the switchgear cabinet is provided to ensure efficient monitoring of thermal stresses. The paper unequivocally highlights the advantages of conducting infrared thermography inspections on MV electrical equipment. It addresses the essential aspects of wireless thermal stress monitoring within MV switchgear cabinets. Furthermore, it decisively outlines the benefits and drawbacks of the MV switch gears cabinets current nonintrusive methods for monitoring the temperature of electrical components, establishing a clear understanding of their effectiveness. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | en_US |
| dc.relation.ispartofseries | 2025 International Conference on Electromechanical and Energy Systems (SIELMEN); | |
| dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
| dc.subject | condition monitoring | en_US |
| dc.subject | infrared windows | en_US |
| dc.subject | nonintrusive methods | en_US |
| dc.title | Infrared thermal stresses monitoring of medium voltage switchgear cabinet | en_US |
| dc.type | Article | en_US |
The following license files are associated with this item: