Abstract:
Ge-Sb-Te phase-change materials in compositions close to Ge2Sb2Te5 and doped with Sn
have been proposed to improve performance of phase-change memories (PCM) [1]. In a previous
work we found that Sb70Te30 thin films show a sharp fall in the electrical resistance in a narrow
temperature range when heating [2]. Thus, in this work we studied the effect of the addition of tin
to this composition.