Browsing 2013 by Author "BĂJENESCU, Titu-Marius I."

Sort by: Order: Results:

  • Micro-comutatoare RF MEMS: fiabilitate, moduri şi mecanisme de defectare 
    BĂJENESCU, Titu-Marius I. (Tehnica UTM, 2013)
    După o introducere a subiectului, sunt discutate stadiul actual, mecanismele de defectare, stresurile operaţionale şi ambientale, injecţiile şi capcanele de sarcini, modurile de defectare mecanice, defectările depinzând ...
  • Packaging of nanodevices and reliability 
    BÂZU, M.I.; BĂJENESCU, Titu-Marius I. (Tehnical University of Moldova, 2013)
    A scientific and technical revolution has begun that is based upon the ability to systematically organize and manipulate matter on the nanometer length scale, but the nanodevices packaging is an important source of failure ...
  • Some ways to improve products reliability 
    BĂJENESCU, Titu-Marius I. (Technical University of Moldova, 2013)
    Failure is absolutely necessary for the health and vitally of the system as a whole. To achieve product reliability, we must ask the question ‘‘what will wear out before the end of the customer expected product life and ...

Search DSpace


Browse

My Account