IL’CHENKO, V. V.; YUSHCHENKO, A. V.; GUL, R. V.; IL’CHENKO, L. G.
(Technical University of Moldova, 2005)
In this work the properties of the heterostructure (In2O3+5%Sn ) -p-Si with the mass thickness of the nano scale layer about 18 nm at the change of the gas environment from the laboratory atmosphere to the saturated vapor ...