SIDORENKO, A. S.; ZDRAVKOV, V. I.; PREPELITSA, A. A.; HELBIG, C.; LUO, Y.; GSELL, S.; SCHRECK, M.; KLIMM, S.; HORN, S.; TAGIROV, L. R.; TIDECKS, R.
(WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim, 2003)
We investigated Nb/Ni bilayers prepared by magnetron sputtering on glass subtrates. The quality of the films was characterized by small-angle X-ray diffraction analysis. The thickness of the layers was determined by the ...