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<title>10th International Symposium on Dielectric Materials and Applications (ISyDMA’10)</title>
<link href="https://repository.utm.md/handle/5014/37296" rel="alternate"/>
<subtitle>Chisinau, Republic of Moldova, June 30 - July 4, 2026</subtitle>
<id>https://repository.utm.md/handle/5014/37296</id>
<updated>2026-10-13T13:20:10Z</updated>
<dc:date>2026-10-13T13:20:10Z</dc:date>
<entry>
<title>Optical, electrical, and gas sensing properties of ZnO dielectric films on black silicon substrates</title>
<link href="https://repository.utm.md/handle/5014/37329" rel="alternate"/>
<author>
<name>AYVAZYAN, G.</name>
</author>
<author>
<name>KHUDAVERDYAN, S.</name>
</author>
<author>
<name>LAKHOYAN, L.</name>
</author>
<author>
<name>VASEASHTA, A.</name>
</author>
<id>https://repository.utm.md/handle/5014/37329</id>
<updated>2026-10-13T06:31:49Z</updated>
<published>2026-01-01T00:00:00Z</published>
<summary type="text">Optical, electrical, and gas sensing properties of ZnO dielectric films on black silicon substrates
AYVAZYAN, G.; KHUDAVERDYAN, S.; LAKHOYAN, L.; VASEASHTA, A.
This work reports a detailed study of the optical, electrical, and gas sensing properties of ZnO dielectric films deposited on black silicon (b-Si) substrates. The b-Si surface was fabricated using reactive ion etching (RIE), enabling the formation of dense, high-aspect-ratio nanostructures that provide strong light trapping and a significantly increased effective surface area. ZnO dielectric films were deposited onto the nanostructured b-Si substrates using the sol–gel method, ensuring good film uniformity and conformal coverage of the textured surface. Optical characterization revealed a pronounced reduction in surface reflectance and enhanced optical absorption over a broad spectral range compared to planar silicon, resulting from the combined effects of the b-Si nanostructure and the ZnO coating. Electrical measurements demonstrated stable dielectric behavior, low leakage currents, and well-defined capacitance–voltage characteristics, indicating high-quality ZnO films and a stable ZnO/b-Si interface. Gas sensing experiments showed a strong, reversible, and reproducible response to nitrogen dioxide (NO2) at relatively low operating temperatures. The enhanced sensing performance is attributed to the high specific surface area of the RIE-fabricated b-Si, efficient adsorption of NO2 molecules on the ZnO surface, and effective charge transfer across the ZnO/b-Si heterojunction. These results demonstrate the strong synergistic effect between sol–gel-derived ZnO dielectric films and nanostructured substrate, highlighting the potential of ZnO/b-Si structures for low-power NO₂ gas sensors as well as multifunctional optoelectronic and environmental monitoring applications.
</summary>
<dc:date>2026-01-01T00:00:00Z</dc:date>
</entry>
<entry>
<title>Structural, photocatalytic, and dielectric properties of glass-ceramics</title>
<link href="https://repository.utm.md/handle/5014/37328" rel="alternate"/>
<author>
<name>ASSAMADI, Chaima</name>
</author>
<author>
<name>EL MASLOUMI, Mohamed</name>
</author>
<author>
<name>EL ABIAD, Abdelaziz</name>
</author>
<author>
<name>AOUAD, Hakima</name>
</author>
<id>https://repository.utm.md/handle/5014/37328</id>
<updated>2026-10-13T06:29:52Z</updated>
<published>2026-01-01T00:00:00Z</published>
<summary type="text">Structural, photocatalytic, and dielectric properties of glass-ceramics
ASSAMADI, Chaima; EL MASLOUMI, Mohamed; EL ABIAD, Abdelaziz; AOUAD, Hakima
Glass-ceramic materials have attracted significant interest due to their tunable structure and multifunctional properties, making them suitable for advanced technological applications. In this study, glass-ceramics were synthesized using the melt-quenching method followed by controlled heat treatment to induce crystallization. Structural investigations were carried out using X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FTIR), and scanning electron microscopy (SEM), revealing the formation of well-dispersed crystalline phases embedded within an amorphous glassy matrix.
</summary>
<dc:date>2026-01-01T00:00:00Z</dc:date>
</entry>
<entry>
<title>Dielectric Nanoparticles for EMI shielding applications</title>
<link href="https://repository.utm.md/handle/5014/37327" rel="alternate"/>
<author>
<name>RAJI, M.</name>
</author>
<id>https://repository.utm.md/handle/5014/37327</id>
<updated>2026-10-13T06:27:56Z</updated>
<published>2026-01-01T00:00:00Z</published>
<summary type="text">Dielectric Nanoparticles for EMI shielding applications
RAJI, M.
The rapid growth of electronic devices, wireless communication systems, and high-frequency technologies has significantly increased electromagnetic radiation in modern environments, leading to serious electromagnetic interference (EMI) challenges. EMI can disrupt electronic systems, decrease device reliability, and weaken communication networks. As a result, developing efficient, lightweight, and sustainable EMI shielding materials has become a key research focus. While conventional metallic shields provide high electrical conductivity and strong reflection-based shielding, they also have disadvantages, including high density, corrosion susceptibility, and limited design flexibility.
</summary>
<dc:date>2026-01-01T00:00:00Z</dc:date>
</entry>
<entry>
<title>Quantitative phase imaging by all-fiber polarized digital holographic microscopy</title>
<link href="https://repository.utm.md/handle/5014/37326" rel="alternate"/>
<author>
<name>CAZAC, Veronica</name>
</author>
<author>
<name>LOSMANSCHII, Constantin</name>
</author>
<author>
<name>BOTNARI, Vladislav</name>
</author>
<author>
<name>ABASHKIN, Vladimir</name>
</author>
<author>
<name>ACHIMOVA, Elena</name>
</author>
<id>https://repository.utm.md/handle/5014/37326</id>
<updated>2026-10-13T06:26:19Z</updated>
<published>2026-01-01T00:00:00Z</published>
<summary type="text">Quantitative phase imaging by all-fiber polarized digital holographic microscopy
CAZAC, Veronica; LOSMANSCHII, Constantin; BOTNARI, Vladislav; ABASHKIN, Vladimir; ACHIMOVA, Elena
In this work, we present an optical fiber-based polarized digital holographic microscopy system designed to improve interferometric stability and measurement precision. The proposed architecture integrates monomode optical fibers into the interferometric setup, forming a compact and robust “all-in-fiber” configuration. This approach minimizes alignment complexity and significantly reduces sensitivity to external disturbances. The system enables non-destructive, label-free imaging of transparent samples, making it particularly suitable for biological and material science applications. Dedicated software tools are developed for data acquisition and numerical reconstruction, allowing accurate phase retrieval and three-dimensional visualization. Experimental results describe the polarization calibration procedure for the developed instrument for estimating the sensitivity for quantitative birefringence measurements. The proposed FO-PDHM system represents a promising platform for advanced interferometric imaging, offering flexibility, precision, and applicability across multidisciplinary research fields.
</summary>
<dc:date>2026-01-01T00:00:00Z</dc:date>
</entry>
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