Low noise amplification reliability issues

Abstract

The recent boom in wireless consumer applications has emphasized the requirement for low-cost, highly integrated RF parts. pHEMTs have become the technology of choice for current system requirements. A key requirement for all systems is high reliability components that do not fail or degrade in performance during the life cycle of the product. A confident use of these technologies relies on our capacity to better understand their fault mechanisms, and our ability to deduce related fault models.