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The analysis of Nb and Cu41Ni59 - alloy thin films by atomic force microscopy

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dc.contributor.author MORARI, R.
dc.contributor.author AWAWDEH, A.
dc.contributor.author ZDRAVKOV, V.
dc.contributor.author MORARI, C.
dc.contributor.author SIDORENKO, A.
dc.date.accessioned 2019-12-04T10:49:41Z
dc.date.available 2019-12-04T10:49:41Z
dc.date.issued 2012
dc.identifier.citation MORARI, R., AWAWDEH, A., ZDRAVKOV, V. et al. The analysis of Nb and Cu41Ni59 - alloy thin films by atomic force microscopy. In: Telecommunications, Electronics and Informatics- ICTEI 2012: proc. of the 5th intern. conf., Technical University of Moldova, May 11-13, 2012. Chișinău, 2012, Vol. 1, pp. 82-87. ISBN 978-9975-45-082-9. en_US
dc.identifier.isbn 978-9975-45-082-9
dc.identifier.uri http://repository.utm.md/handle/5014/7238
dc.description.abstract This work is one part of a whole project for elaboration of a superconducting spinswitch. At a certain stage there was the need to develop technologies of magnetron sputtering of mirror-smooth film structures. AFM microscope acted as feedback for controlling the quality of the surface of films and for correction of deposition regimes. The paper is a detailed review of the deposition regimes of each layer (superconducting Nb and ferromagnetic alloy Cu41Ni59), and also the basic description of the work on the AFM microscope. en_US
dc.language.iso en en_US
dc.publisher Technical University of Moldova en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject spintronics en_US
dc.subject magnetron sputtering en_US
dc.subject sputtering en_US
dc.subject surface topographic models en_US
dc.subject thin films en_US
dc.title The analysis of Nb and Cu41Ni59 - alloy thin films by atomic force microscopy en_US
dc.type Article en_US


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