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Design for testability of combinational circuits

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dc.contributor.author COJOCARU, Ion
dc.contributor.author FLUERASU, Cezar
dc.contributor.author PASCU, Adrian
dc.date.accessioned 2019-11-12T09:39:28Z
dc.date.available 2019-11-12T09:39:28Z
dc.date.issued 2005
dc.identifier.citation COJOCARU, Ion, FLUERASU, Cezar, PASCU, Adrian. Design for testability of combinational circuits. In: Microelectronics and Computer Science: proc. of the 4th intern. conf., September 15-17, 2005. Chişinău, 2005, vol. 2, pp. 119-123. SBN 9975-66-038-X. en_US
dc.identifier.uri http://repository.utm.md/handle/5014/6686
dc.description.abstract A new concept of design for testability is being proposed, based on the properties of signals, gates and logical structures. This allows obtaining of reconfigurable elementary digital structures (REDS), which can work both in normal mode and in testing/ diagnosis mode. In the same way as on a filed covered with snow any non-uniform object can be observed, the digital structures, designed on REDS base, allow the control of all defects ≡0, ≡1, using of only two stimulating-vectors. Diagnosis of singular constant defects ≡0, ≡1 of combinational circuits (CC) requires about 2*n stimulating vectors, where n represents the number of primary inputs of the circuit. The cost of these facilities is doubling the number of active components on a chip and including of 2 pins in order to guarantee the reconfiguration of the verified structure. In case of a CC generalized model - including of 2 more pins in order to “homogenate” an arbitrary CC with different parities of the convergent signals. en_US
dc.language.iso en en_US
dc.publisher Technical University of Moldova en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject design en_US
dc.subject testability en_US
dc.subject combinational circuits en_US
dc.title Design for testability of combinational circuits en_US
dc.type Article en_US


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