dc.contributor.author | TSIULYANU, Dumitru | |
dc.date.accessioned | 2019-07-11T10:48:41Z | |
dc.date.available | 2019-07-11T10:48:41Z | |
dc.date.issued | 2017 | |
dc.identifier.citation | TSIULYANU, Dumitru. Characterization of gas sensitive chalcogenide films by impedance spectroscopy. In: Microelectronics and Computer Science: proc. of the 9th intern. conf., October 19-21, 2017. Chişinău, 2017, p. 477. ISBN 978-9975-4264-8-0. | en_US |
dc.identifier.isbn | 978-9975-4264-8-0 | |
dc.identifier.uri | http://repository.utm.md/handle/5014/3445 | |
dc.language.iso | en | en_US |
dc.publisher | Technical University of Moldova | en_US |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
dc.subject | chalcogenide films | en_US |
dc.subject | impedance | en_US |
dc.subject | spectroscopy | en_US |
dc.subject | pelicule căldogenide | en_US |
dc.subject | sensibilitate la gaze | en_US |
dc.subject | spectroscopie | en_US |
dc.subject | impedanță | en_US |
dc.title | Characterization of gas sensitive chalcogenide films by impedance spectroscopy | en_US |
dc.type | Article | en_US |
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