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Compensarea şi mascarea erorilor în conceptul DALG-II

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dc.contributor.author COJOCARU, Ion
dc.contributor.author ŞERBANAŢI, Luca
dc.contributor.author PĂVĂLOIU, Bujor
dc.contributor.author RADOVICI, Alexandru
dc.contributor.author VASILOŢEANU, Andrei
dc.date.accessioned 2024-01-11T12:07:32Z
dc.date.available 2024-01-11T12:07:32Z
dc.date.issued 2009
dc.identifier.citation COJOCARU, Ion et al. Compensarea şi mascarea erorilor în conceptul DALG-II. In: Microelectronics and Computer Science: proc. 6th International Conference, 1-3 Oct. 2009, Chişinău, Republica Moldova, vol. 1, 2009, pp. 293-297. ISBN 978-9975-45-045-4. ISBN 978-9975-45-122-2 (vol. 1). en_US
dc.identifier.isbn 978-9975-45-045-4
dc.identifier.isbn 978-9975-45-122-2
dc.identifier.uri http://repository.utm.md/handle/5014/25794
dc.description.abstract Functionality increase led to maximizing of the integrated circuits (IC) complexity. The time for test generation reached up to 10-15 months, and some of the faults of the combinational circuits (CC) with convergent fan-outs (CFO), according to [1], could nor be generated within the frame of DALG-I concept for activation the unique path in the circuit. For overrunning this impasse, development of the new efficient test generating algorithms was proposed; these algorithms should diminish the number of the tests and the time needed for their generation. Schneider [1] brought an example of CC with CFO – for the fault 6 ≡ 0 the test could not be generated based on the DALG-I concept of unique path activation, even if this test exists. As a result, the algorithm DALG-II of test generation [2] was proposed based on the simultaneous activation of all the CFO paths. DALG-II is an efficient algorithm, well formalized mathematically, allowing generation of the tests in all the cases when it is possible. These advantages of DALG-II compared to DALG-I should not undermined the fact that DALG-I is based on the singular constant error method (SCE) and activation of the single path through CC, while DALG-II is based on simultaneous activation of all FOC paths and implicit it is based on the model of multiple constant errors (MCE). At the same time, DALG-I allows obtaining of diagnosis tests, while DALG-II allows obtaining only the fault detection tests. More than that, in DALG-II and MCE case the faults interaction could occur, as well as fault compensation and/or fault masking. The paper presents the results of an interaction study in case of MCE and simultaneous activation of all CFO paths. en_US
dc.language.iso ro en_US
dc.publisher Technical University of Moldova en_US
dc.relation.ispartof Proceeding of the 6th International Conference on "Microelectronics and Computer Science", oct.1-3, 2009, Chişinău, Moldova
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject fault compensation en_US
dc.subject fault excitation en_US
dc.subject fault masking en_US
dc.subject fault propagation en_US
dc.subject test generation en_US
dc.title Compensarea şi mascarea erorilor în conceptul DALG-II en_US
dc.type Article en_US


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