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The device and method for measuring the parameters of nanosensors based on semiconductor nanostructured oxides in the range of microwatts

The device and method for measuring the parameters of nanosensors based on semiconductor nanostructured oxides in the range of microwatts

VERJBIŢKI, Valeri; LUPAN, Oleg; RAILEAN, Serghei
URI: http://repository.utm.md/handle/5014/20453
Date: 2018

Abstract:

The device for measuring the resistance of nanostructure of semiconductor oxide sensors includes an adjustable reference voltage source connected to a series-connected nanostructure Rx and a reference resistance R0, the voltage drop of which is applied to the inputs of the microprocessor's analog-to-digital converters (ADC).

Description:

Application s 2017 0139, 2017.12.27. Patent: http://www.db.agepi.md/Inventions/details/s%202017%200139. Exibits Clasification: 1. Environment - Pollution Control.

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  • 2018
    Proceedings of the 10th Edition of European Exhibition of Creativity and Innovation, Romania
Attribution-NonCommercial-NoDerivs 3.0 United States Except where otherwise noted, this item's license is described as Attribution-NonCommercial-NoDerivs 3.0 United States

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