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Device and method for measuring the resistance of a sensor based on nanostructured semiconductor oxides in the range of the order of microwatts
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| dc.contributor.author | VERJBIŢKI, Valeri | |
| dc.contributor.author | LUPAN, Oleg | |
| dc.contributor.author | RAILEAN, Serghei | |
| dc.date.accessioned | 2022-05-25T07:35:48Z | |
| dc.date.available | 2022-05-25T07:35:48Z | |
| dc.date.issued | 2020 | |
| dc.identifier.citation | VERJBIŢKI, Valeri, LUPAN, Oleg, RAILEAN, Serghei. Device and method for measuring the resistance of a sensor based on nanostructured semiconductor oxides in the range of the order of microwatts. In: European Exhibition of Creativity and Innovation: proc. of the 12th ed. EUROINVENT, Iasi, Romania, 2020, p. 165. ISSN 2601-4564. e-ISSN 2601-4572. | en_US |
| dc.identifier.issn | 2601-4564 | |
| dc.identifier.issn | 2601-4572 | |
| dc.identifier.uri | http://repository.utm.md/handle/5014/20399 | |
| dc.description | Patent number MD 1269 Z, 2018.07.31. Exibits Clasification: 1. Environment - Pollution Control. | en_US |
| dc.description.abstract | The device comprises an adjustable reference voltage source connected to the output of a microcontroller and connected in series to the investigated nanostructured sensor and to the reference resistor, the connection point of which to the investigated sensor is connected to the input of the microcontroller. The method consists in: measuring the voltage of the reference voltage source, measuring the voltage drop across the reference resistor, calculating the voltage drop across the investigated nanostructure. Current flowing through the nanostructure and the applied power to the nanostructure are calculated and it is set the value of the reference voltage so that the electrical power will not exceed the maximum permitted value. | en_US |
| dc.language | en | |
| dc.publisher | Romanian Inventors Forum | en_US |
| dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
| dc.subject | invenţii | en_US |
| dc.subject | inventions | en_US |
| dc.subject | voltage sources | en_US |
| dc.subject | reference voltage source | en_US |
| dc.subject | nanostructures | en_US |
| dc.subject | semiconductor oxides | en_US |
| dc.subject | sensors | en_US |
| dc.title | Device and method for measuring the resistance of a sensor based on nanostructured semiconductor oxides in the range of the order of microwatts | en_US |
| dc.type | Article | en_US |
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2020
Proceedings of the 12 th Edition of European Exhibition of Creativity and Innovation, Romania
Except where otherwise noted, this item's license is described as Attribution-NonCommercial-NoDerivs 3.0 United States