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Optical-electronic moments feature-based recognition system controlled by parameters of the input images

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dc.contributor.author PERJU, Veacheslav L.
dc.contributor.author CASASENT, David P.
dc.contributor.author PERJU, Veacheslav V.
dc.contributor.author ZAVROTSCKI, Serghei N.
dc.date.accessioned 2022-04-22T09:00:03Z
dc.date.available 2022-04-22T09:00:03Z
dc.date.issued 2003
dc.identifier.citation PERJU, Veacheslav L., CASASENT, David P., PERJU, Veacheslav V. et al. Optical-electronic moments feature-based recognition system controlled by parameters of the input images. In: Optical Pattern Recognition 14. 2003. –V. 5106, pp. 241-248. en_US
dc.identifier.uri https://doi.org/10.1117/12.501412
dc.identifier.uri http://repository.utm.md/handle/5014/20208
dc.description Access full text - https://doi.org/10.1117/12.501412 en_US
dc.description.abstract The new methods of invariant pattern recognition (IPR), based on the effective calculation of image moment features are presented. It is described the special purpose multiprocessor computer system, which realizes the proposed methods of IPR. The system is reconfigurable, with the architecture controlled by parameters of the input images. en_US
dc.language.iso en en_US
dc.publisher SPIE en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject invariant pattern recognition en_US
dc.subject images en_US
dc.subject computer systems en_US
dc.title Optical-electronic moments feature-based recognition system controlled by parameters of the input images en_US
dc.type Article en_US


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