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Optical-electronic technologies in materials analysis

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dc.contributor.author PERJU, Veacheslav L.
dc.contributor.author CASASENT, David P.
dc.contributor.author FESHCHENKO, Valeriy S.
dc.contributor.author FESHCHENKO, Lubov V.
dc.date.accessioned 2022-04-22T07:39:50Z
dc.date.available 2022-04-22T07:39:50Z
dc.date.issued 2005
dc.identifier.citation PERJU, Veacheslav L., CASASENT, David P., FESHCHENKO, Valeriy S. et al. Optical-electronic technologies in materials analysis. In: Optical Pattern Recognition 16. 2005. –V. 5816, pp. 315-320. en_US
dc.identifier.uri https://doi.org/10.1117/12.604321
dc.identifier.uri http://repository.utm.md/handle/5014/20205
dc.description Access full text - https://doi.org/10.1117/12.604321 en_US
dc.description.abstract It is proposed a new optical electronic approach for effective, simple and non expensive testing of the materials. An optical correlator is used for high speed features extraction, which characterize the distribution of the informational important elements in the crystallographic image. The digital “portrait” of the analyzed material is constructed which is compared with the set of the standard “portraits” on the base of which the level of the quality of the material is determined. The method permits to automate the process of the crystallographic images analyses and to increase the reliability of the results. en_US
dc.language.iso en en_US
dc.publisher SPIE en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject material testing en_US
dc.subject crystallographic images en_US
dc.subject optical correlators en_US
dc.title Optical-electronic technologies in materials analysis en_US
dc.type Article en_US


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