On reliability of Applied level with Opportunity of MPLS Network Reconfiguration

TSURCANU, D. N.

dc.contributor.author	TSURCANU, D. N.
dc.date.accessioned	2021-12-16T09:23:04Z
dc.date.available	2021-12-16T09:23:04Z
dc.date.issued	2006
dc.identifier.citation	TSURCANU, D. N. On reliability of Applied level with Opportunity of MPLS Network Reconfiguration. In: Microwave & Telecommunication Technology: proc. 16th International Crimean Conference, 11-15 Sept. 2006, Sevastopol, Ukraine, 2006, pp. 332-333. ISBN 966-322-006-6.	en_US
dc.identifier.isbn	966-322-006-6
dc.identifier.uri	https://doi.org/10.1109/CRMICO.2006.256413
dc.identifier.uri	http://repository.utm.md/handle/5014/18458
dc.description	Access full text – https://doi.org/10.1109/CRMICO.2006.256413	en_US
dc.description.abstract	Reliability calculation of an applied level of MPLS network (multiprotocol label switching) is carried out on the basis of the semi-Markov device processes, taking into account an opportunity of reconfiguration and phase integration of a network in general.	en_US
dc.language.iso	en	en_US
dc.publisher	IEEE	en_US
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 United States	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.subject	multi-protocol label switching	en_US
dc.subject	Markov models	en_US
dc.subject	magnetic fluxes	en_US
dc.subject	magnetic force microscopy	en_US
dc.subject	magnetic force microscopy	en_US
dc.subject	Markov processes	en_US
dc.subject	telecommunication network reliability	en_US
dc.title	On reliability of Applied level with Opportunity of MPLS Network Reconfiguration	en_US
dc.type	Article	en_US