Browsing by Subject "X-rays"

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  • Elaborarea dispozitivului pentru măsurarea razelor Roentgen 
    ŢURCAN, Ana (Universitatea Tehnică a Moldovei, 2020)
    Scopul lucrării constă în proiectarea unui dispozitiv de măsurare a razelor Roentgen.
  • Electronii în microinginerie 
    DULGHERU, Valeriu (Institutul de Inginerie Electronică şi Nanotehnologii "D. Ghiţu" al AŞM, 2003)
    The X-ray deep litography, a polymer layer sensitive to X-rays is exposed to Xradiation from a synchrotron or electron storage ring by shading, which transfers an exact image of the abso structures on the mask into the ...
  • Fenomenul de recombinare iradiațională în compușii tioindaților de zinc la excitarea cu raze X și electroni accelerați 
    ARAMĂ, E.; PÎNTEA, V. (Tehnica UTM, 2018)
    This article provides the investigation results concerning the Roentgen luminescence of ternary compounds ZnxIn2S3+x (x= 1,2,3) at 300 and 100K . It highlights the peculiarities of luminescent radiation stimulation by X ...
  • Luminescent properties of triple semiconductors under the action of X rays 
    MACIUGA, A.; RADU, R.; PÎNTEA, V.; STRATAN, I.; NISTIRIUC, I. (Technical University of Moldova, 2005)
    This article focuses on the description of triple semiconductors of type, especially , and the researeh instalation over luminescent properties under the action of accelerated electrons and X-rays. VI III II C B A 4 2 4 2 S CdGa.
  • Luminescenţa compuşilor ternari sub influenţa electronilor acceleraţi şi razelor X 
    MACIUGA, A.; RADU, R.; PÎNTEA, V.; STRATAN, I.; NISTIRIUC, I. (Editura U.T.M., 2006)
    Se descrie tehnologia de creştere a semiconductorilor tripli de tipul АIIB2IIIC4IV, în special CdGa2S4 şi instalaţia de cercetări asupra proprietăţilor luminescente sub acţiunea electronilor acceleraţi şi razelor X. Este ...
  • Raman scattering investigation of MnxFe1−xIn2S4 solid solutions 
    GUC, M.; URSAKI, V. V.; BODNAR, I. V.; LOZHKIN, D. V.; ARUSHANOV, E.; IZQUIERDO-ROCA, V.; PÉREZ RODRÍGUEZ, A. (ELSEVIER, 2012)
    Spinel-type MnxFe1−xIn2S4 solid solutions grown by the planar melt crystallization method (the horizontal version of the Bridgman method) are investigated by means of energy dispersive X-ray analysis and Raman scattering ...
  • Temperature dependence of the optical gap CuGa5Se8 
    NATEPROV, A.; LEVCENCO, S.; SYRBU, N. N. (Institutul de Fizică Aplicată, AŞM, 2006)
    The investigation of the absorption coefficient spectra below the fundamental edge of ordered vacancy compound CuGa5Se8 was studied early for samples prepared by Bridgman method. Compositional measurements were carried out ...
  • X-ray induced luminescence in ZnIn2S4 and Zn3In2S6 
    MACHUGA, A.; RADU, R.; PINTEA, V.; ARAMA, E.; ZHITAR, V.; SHEMYAKOVA, T. (Institutul de Fizică Aplicată, AŞM, 2006)
    Compounds belonging to the system ZnxIn2S3 + x are of special interest due to their peculiar properties. Intensive luminescence and high photosensitivity in visible and ultraviolet range determine their potential applicability ...

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